[Eeglablist] Use of pattern lacunarity in processing the topoplots of IC components

[James Jones-Rounds]

Hi Sairamya,

It seems technically plausible, considering the description of lacunarity
in http://www.cv-foundation.org/openaccess/content_cvpr_
2014/papers/Quan_Lacunarity_Analysis_on_2014_CVPR_paper.pdf

I suppose you'd either need to save the topography plots as images, and
perform the analyses on the image, or save the underlying data matrix that
informs the topographic plot, which is fairly straightforward to extract as
an output from the "topoplot" function that creates the image.

As to whether the lacunarity will be meaningful..that's another question.
It seems from my experience that the most meaningful topographies (the ones
that reflect clear point-source neural or artifactual components or scalp
activations) are the least interesting as images. These most meaningful
components typically have minimal changes in their topographic plots, from
pixel to pixel, except for at the borders where the emanating voltage
changes dissipate or reverse. The components that have wilder, more varied,
mottled and speckled scalp topographies might exhibit higher lacunarity.
They might thus be more amenable to such lacunarity spectrum image
processing methods. But these more variegated topographic plots themselves
are not traditionally considered meaningful, because they seem to reflect
more background noise than signal. However, maybe your analyses could help
overturn that impression!

James

On Tue, Jul 11, 2017 at 3:00 PM, <eeglablist-request at sccn.ucsd.edu> wrote:

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>    1. Use of pattern lacunarity in processing the topoplots     of IC
>       components-Reg (SAIRAMYA N J RR16EC001)
>
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> ---------- Forwarded message ----------
> From: SAIRAMYA N J RR16EC001 <sairamyanj at karunya.edu.in>
> To: <eeglablist at sccn.ucsd.edu>
> Cc:
> Bcc:
> Date: Tue, 11 Jul 2017 11:18:21 +0530
> Subject: [Eeglablist] Use of pattern lacunarity in processing the
> topoplots of IC components-Reg
> Hi.
>      Currently, I am working in applying image processing algorithms to
> analyse the topoplots of IC components. Is it possible to use pattern
> lacunarity spectrum(PLS) to analyse the topoplots.
>
> Thank you
>
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-- 
James Jones-Rounds
Laboratory Manager
Human Development EEG and Psychophysiology (HEP) Laboratory,
Department of Human Development,
--------------------------------------------
Cornell University | Ithaca, NY
607-255-9883
eeg at cornell.edu
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